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Reliability Based Design Using Variable Fidelity Optimization
Author(s) -
Shawn Gano,
Harish Agarwal,
John E. Renaud,
Andrés Tovar
Publication year - 2005
Publication title -
54th aiaa/asme/asce/ahs/asc structures, structural dynamics, and materials conference
Language(s) - Uncategorized
Resource type - Conference proceedings
DOI - 10.2514/6.2005-2135
Subject(s) - computer science , reliability (semiconductor) , variable (mathematics) , reliability engineering , fidelity , engineering , mathematics , mathematical analysis , power (physics) , physics , quantum mechanics , telecommunications

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