Exposure of polymer film thermal control materials on the Materials International Space Station Experiment (MISSE)
Author(s) -
Edward A. Sechkar,
Greg Tollis,
Joyce A. Dever,
Sharon K. Miller,
Russell Messer
Publication year - 2001
Publication title -
2001 conference and exhibit on international space station utilization
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2514/6.2001-4924
Subject(s) - international space station , polymer , thermal , materials science , aerospace engineering , space (punctuation) , engineering physics , environmental science , computer science , mechanical engineering , engineering , composite material , meteorology , physics , operating system
Seventy-nine samples of polymer film thermal control (PFTC) materials have been provided by the National Aeronautics and Space Administration (NASA) Glenn Research Center (GRC) for exposure to the low Earth orbit environment on the exterior of the International Space Station (ISS) as part of the Materials International Space Station Experiment (MISSE). MISSE is a materials flight experiment sponsored by the Air Force Research Lab/Materials Lab and NASA. This paper will describe background, objectives, and configurations for the GRC PFTC samples for MISSE. These samples include polyimides, fluorinated polyimides, and Teflon fluorinated ethylene propylene (FEP) with and without second-surface metallizing layers and/or surface coatings. Also included are polyphenylene benzobisoxazole (PBO) and a polyarylene ether benzimidazole (TOR-LM). On August 16, 2001, astronauts installed passive experiment carriers (PECs) on the exterior of the ISS in which were located twenty-eight of the GRC PFTC samples for 1-year space exposure. MISSE PECs for 3-year exposure, which will contain fifty-one GRC PFTC samples, will be installed on the ISS at a later date. Once returned from the ISS, MISSE GRC PFTC samples will be examined for changes in optical and mechanical properties and atomic oxygen (AO) erosion. Additional sapphire witness samples located on the AO exposed trays will be examined for deposition of contaminants.
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