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A Prediction Model of the Depth-Of-Discharge Effect on the Cycle Life of a Storage Cell
Author(s) -
L. H. Thaller,
Hong S. Lim
Publication year - 1987
Publication title -
nasa technical reports server (nasa)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2514/6.1987-9080
Subject(s) - computer science , reliability engineering , engineering
Cycle life requirements are very high for batteries used in aerospace applications in low Earth orbit. The data base required to establish confidence in a particular cell design is thus both extensive and expensive. Reliable accelerated cycle life testing and performance decay modeling represent attractive alternatives to real-time tests of cycle life. In light of certain long-term cycle life test results, this paper examines a very simple performance decay model developed earlier. Application of that model to available data demonstrates a rigid relationship between a battery's expected cycle life and the depth of discharge of cycling. Further, modeling analysis of the data suggests that a significantly improved cycle life can be obtained with advanced components, materials, and designs; and that cycle life can be reliably predicted from the results of accelerated testing.

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