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A radiation-hardened bulk CMOS technology
Author(s) -
W. N. Dawes,
D. H. Habing
Publication year - 1979
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Conference proceedings
DOI - 10.2514/6.1979-1902
Subject(s) - cmos , radiation hardening , radiation , optoelectronics , materials science , electrical engineering , physics , engineering , optics

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