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A Comparative Study of Sub-10nm Si, Ge and GaAs n-Channel FinFET
Author(s) -
Shafiqul Islam et al. Shafiqul Islam et al.
Publication year - 2017
Publication title -
international journal of semiconductor science and technology
Language(s) - English
Resource type - Journals
eISSN - 2278-9405
pISSN - 2250-1576
DOI - 10.24247/ijsstdec20171
Subject(s) - materials science , channel (broadcasting) , optoelectronics , engineering physics , electrical engineering , physics , engineering
editor@tjprc.org A COMPARATIVE STUDY OF SUB-10NM SI, GE AND GAAS N-CHANNEL FINFET SHAFIQUL ISLAM , SHARIF UDDIN , HASAN ALI , JAVED HOSSAIN & ZAHID HASAN MAHMUD 5 1, 2, 3 Department of Electronics and Telecommunication En gineering, Begum Rokeya University, Rangpur, Bangla desh Department of Computer Science and Telecommunication Engineering, Noakhali Science and Technology University, Noakhali, Bangladesh Department of Electrical and Electronic Engineering , University of Dhaka, Dhaka, Bangladesh ABSTRACT

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