Modelling and Testing Shocks

Suppose a device is subjected to a sequence of shocks. This paper deals with the relationship between the life distribution of the device and the probability of surviving the first k ( k= 0, 1,2,…) shocks, using cumulative damage models as introduced by Esary et al . (1973). Some attention is devoted to a classification of life distributions, tests of exponentiality versus IFR and NBU, and ML estimation of the survival distribution.