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Properties of Zig-zag nickel nanostructures obtained by glad technique
Author(s) -
Jelena Potočnik,
Miloš Nenadović,
Bojan Jokić,
M. Popović,
Zlatko Rakočević
Publication year - 2016
Publication title -
science of sintering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.309
H-Index - 25
eISSN - 1820-7413
pISSN - 0350-820X
DOI - 10.2298/sos1601051p
Subject(s) - nickel , materials science , x ray photoelectron spectroscopy , thin film , scanning electron microscope , contact angle , substrate (aquarium) , nanostructure , energy dispersive x ray spectroscopy , composite material , analytical chemistry (journal) , nanotechnology , chemical engineering , metallurgy , chemistry , oceanography , geology , engineering , chromatography
Zig-zag structure of the nickel thin film has been obtained using Glancing Angle Deposition (GLAD) technique. Glass substrate was positioned 75 degrees with respect to the substrate normal. The obtained nickel thin film was characterized by X-ray Photoelectron Spectroscopy, Scanning Electron Microscopy and Atomic Force Microscopy. Surface energy of the deposited thin film was determined by measuring the contact angle using the static sessile drop method. [Projekat Ministarstva nauke Republike Srbije, br. III 45005

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