Raman spectroscopy of optical properties in CdS thin films
Author(s) -
J. Trajić,
Martina Gilić,
N. Romčević,
M. Romčević,
G. Stanišić,
B. Hadžić,
M. Petrović,
Yasmin Yahia
Publication year - 2015
Publication title -
science of sintering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.309
H-Index - 25
eISSN - 1820-7413
pISSN - 0350-820X
DOI - 10.2298/sos1502145t
Subject(s) - raman spectroscopy , materials science , thin film , raman scattering , spectroscopy , phonon , analytical chemistry (journal) , evaporation , permittivity , atomic force microscopy , optics , optoelectronics , nanotechnology , dielectric , chemistry , condensed matter physics , physics , quantum mechanics , chromatography , thermodynamics
Properties of CdS thin films were investigated applying atomic force microscopy (AFM) and Raman spectroscopy. CdS thin films were prepared by using thermal evaporation technique under base pressure 2 x 10-5 torr. The quality of these films was investigated by AFM spectroscopy. We apply Raman scattering to investigate optical properties of CdS thin films, and reveal existence of surface optical phonon (SOP) mode at 297 cm-1. Effective permittivity of mixture were modeled by Maxwell - Garnet approximation. [Projekat Ministarstva nauke Republike Srbije, br. 45003
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