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Raman and IR spectra of pure and doped forsterite single crystals
Author(s) -
Ana Golubović,
Radoš Gajić,
M. Šćepanović
Publication year - 2009
Publication title -
science of sintering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.309
H-Index - 25
eISSN - 1820-7413
pISSN - 0350-820X
DOI - 10.2298/sos0901043g
Subject(s) - forsterite , raman spectroscopy , materials science , dopant , doping , diffraction , spectral line , analytical chemistry (journal) , single crystal , infrared , lattice (music) , crystallography , mineralogy , optics , chemistry , optoelectronics , physics , chromatography , astronomy , acoustics
Forsterite single crystals were grown by the Czochralski technique in air. The lattice parameters were determined by X-ray power diffraction. The IR and Raman spectra of pure and doped (V3+, V5+, and Ni4+) Mg2SiO4 single crystals were measured at room temperature. We studied the phonon properties and discussed the influence of dopants

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