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Analytic models of CMOS logic in various regimes
Author(s) -
Branko Dokić,
Tatjana Pesic-Brdjanin,
Rados Dabic
Publication year - 2014
Publication title -
serbian journal of electrical engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.133
H-Index - 5
eISSN - 2217-7183
pISSN - 1451-4869
DOI - 10.2298/sjee140106022d
Subject(s) - cmos , transistor , electronic engineering , digital electronics , inversion (geology) , electronic circuit , voltage , computer science , logic gate , threshold voltage , pass transistor logic , pull up resistor , electrical engineering , engineering , paleontology , structural basin , biology
In this paper, comparative analytic models of static and dynamic characteristics of CMOS digital circuits in strong, weak and mixed inversion regime have been described. Term mixed inversion is defined for the first time. The paper shows that there is an analogy in behavior and functional dependencies of parameters in all three CMOS regimes. Comparative characteristics of power consumption and speed in static regimes are given. Dependency of threshold voltage and logic delay time on temperature has been analyzed. Dynamic model with constant current is proposed. It is shown that digital circuits with dynamic threshold voltage of MOS transistor (DT-CMOS) have better logic delay characteristics. The analysis is based on simplified current-voltage MOS transistor models in strong and weak inversion regimes, as well as PSPICE software using 180 nm technology parameters

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