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Electrochemical characterization of the passive films formed on niobium surfaces in H2SO4 solutions
Author(s) -
Irena Arsova,
Abdurauf Prusi,
Toma Grčev,
Ljubomir Arsov
Publication year - 2006
Publication title -
journal of the serbian chemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.227
H-Index - 45
eISSN - 1820-7421
pISSN - 0352-5139
DOI - 10.2298/jsc0602177a
Subject(s) - cyclic voltammetry , amorphous solid , niobium , materials science , electrochemistry , polarization (electrochemistry) , niobium oxide , oxide , thin film , dissolution , raman spectroscopy , chemical engineering , inorganic chemistry , electrode , chemistry , nanotechnology , metallurgy , optics , organic chemistry , physics , engineering
The electrochemical formation and characteristics of passive films on nio- bium surfaces in aqueous H2SO4 solutions were studied using open circuit potential and cyclic voltammetry. In the potential region between -1.0 and 1.2 V (NHE), the cy- clic voltammetry data showed that the active/passive transition involves slow metal dissolution followed by the formation of semiconducting passive oxide films. The possible electrochemical reactions and the change of the oxidation steps of some nio- bium oxides occurring in the passive film during the polarization are proposed. A strong influence of the natural air-formed oxide film on the chemical composition of the passive film was shown. This influence makes chemical structure of thin passive films more complicated than that of thick anodic films. It is shown that the passive films consists of more or less stable oxides, such as NbO, NbO2 and Nb2O5 .T he Raman spectra revealed that the thin passive films were amorphous, while the films formed at higher voltages consist, primarily, of well-crystallized Nb2O5.

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