X-ray diffraction and SEM/EDX studies on technological evolution of the oxide-fluoride ceramic flux for submerged arc-surfacing
Author(s) -
V.E. Sokolsky,
O.S. Roik,
A.V. Davidenko,
V. P. Kazimirov,
Vladyslav V. Lisnyak,
V.I. Galinich,
I.A. Goncharov
Publication year - 2011
Publication title -
journal of mining and metallurgy section b metallurgy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.42
H-Index - 20
eISSN - 2217-7175
pISSN - 1450-5339
DOI - 10.2298/jmmb101223002s
Subject(s) - anorthite , potassium silicate , materials science , ceramic , analytical chemistry (journal) , powder diffraction , scanning electron microscope , mineralogy , diffraction , annealing (glass) , spinel , silicate , sodium silicate , metallurgy , crystallography , composite material , chemical engineering , chemistry , optics , physics , chromatography , engineering
The ceramic flux for submerged arc-surfacing with main component composition MgO (10.0 wt. %)-Al2O3 (25.0 wt. %)-SiO2 (40.0 wt. %)-CaF2 (25.0 wt. %) was prepared in a disk dryer-granulator using a sodium/potassium silicate solution as a binder. X-ray powder diffraction (XRPD) collected at r.t. identified α- phase of quartz, Al2O3, MgO and CaF2 of the initial components in the samples taken after granulation and subsequent annealing at 600 °C. In contrast to the low temperature annealing, anorthite (CaAl2Si2O8) is the main phase in the composition of the samples remelted at 1500 °C and quenched subsequently. Chemical analysis performed by means of scanning electron microscopy with energy-dispersive X-ray spectroscopy analysis (SEM/EDX) detects that the grains of the remelted samples possess the same Ca : Al : Si elemental ratio as anorthite. High temperature X-ray diffraction (HTXRD) was used to examine structural transformation in the solid at 600 °C < T < 1200 °C and stages of thermal evolution of ceramic flux were determined. The ceramic flux melts completely at the temperature above 1350 °C. The intensity pattern of the flux melt was obtained by X-ray diffraction of scattered X-rays at 1450 °C. After calculating the structure factor (SF), the radial distribution function (RDF) was evaluated and used to calculate the structural basicity of the flux melt
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