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The concentration profiles of thin-film Pt/bulk Ni coatings annealed at 1150,  1250 and 1300°C for different time were measured by means of electron probe  microanalysis. The corresponding interdiffusion coefficients were then  determined using the thin-film solution. The calculated concentration  profiles based on the presently obtained interdiffusion coefficients agree  well with the experimental ones, but better at a higher temperature or a  longer time. The comparison between the presently measured concentration  profiles and the DICTRA simulated ones indicates that it is promising to  apply the well-established atomic mobility databases due to bulk diffusion  information in coating systems with some simple modifications for  diffusivities

Experimental investigation and computer simulation of diffusion in Pt-coated bulk Ni