A MIM capacitor study of dielectric charging for RF MEMS capacitive switches | Zendy

L. Michalas | Zendy; M. Koutsoureli | Zendy; E. Papandreou | Zendy; A. Gantis | Zendy; G. Papaioannou | Zendy

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A MIM capacitor study of dielectric charging for RF MEMS capacitive switches

Author(s) -

L. Michalas,

M. Koutsoureli,

E. Papandreou,

A. Gantis,

G. Papaioannou

Publication year - 2015

Publication title -

facta universitatis - series electronics and energetics

Language(s) - English

Resource type - Journals

eISSN - 2217-5997

pISSN - 0353-3670

DOI - 10.2298/fuee1501113m

Subject(s) - capacitor , capacitive sensing , microelectromechanical systems , dielectric , materials science , transient (computer programming) , electrical engineering , optoelectronics , electronic engineering , computer science , engineering , voltage , operating system

MIM capacitors are considered equally important devices for the assessment of dielectric charging in RF MEMS capacitive switches. Beside the obvious similarities between the down state condition of RF MEMS and MIM capacitors there are also some important differences. The paper aims to introduce a novel approach to the study of dielectric charging in MEMS with the aid of MIM capacitors by combining experimental results obtained by the application of DC, Charging Transient and Kelvin Probe techniques. The strengths and weaknesses are discussed in conjunction with experimental results obtained on SiNx based MIM capacitors and MEMS capacitive switches fabricated under the same conditions

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