Open AccessMicrowave imaging at the nanoscale: quantitative measurements for semiconductor devices, materials science and bio-applications
Author(s) -
Ferry Kienberger
Publication year - 2016
Publication title -
infocus magazine
Language(s) - English
Resource type - Journals
ISSN - 1750-4740
DOI - 10.22443/rms.inf.1.145
Subject(s) - nanoscopic scale , nanotechnology , materials science , semiconductor , microwave , optoelectronics , engineering physics , computer science , engineering , telecommunications
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