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In this work, the X-ray diffraction (XRD) measurement have been done to study the structure of K2CrO4, and K2Cr2O7 powders. The morphology of K2CrO4, and K2Cr2O7 thin films has been studied by using Atomic Force Microscopy (AFM) technique. Modes of vibrations for both K2CrO4, and K2Cr2O7 compounds were measured and discussed using Fourier transform infrared spectroscopy (FTIR). [DOI: 10.22401/JNUS.20.2.09]

Study the Structure, Morphology and Vibration Modes for K2CrO4 and K2Cr2O7