Open AccessElectrical Impedance Tomography in 3D: Characterization and Evaluation
Author(s) -
Justin Wagenaar
Publication year - 2015
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.22215/etd/2015-11124
Subject(s) - electrical impedance tomography , imaging phantom , tomography , offset (computer science) , physics , characterization (materials science) , electrical impedance , acoustics , materials science , biomedical engineering , computer science , engineering , optics , programming language , quantum mechanics
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