
An architecture-based self-adaptive framework for performance and reliability improvement
Author(s) -
Xu Zhang
Publication year - 2018
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.22215/etd/2010-09372
Subject(s) - reliability engineering , reliability (semiconductor) , architecture , computer science , computer architecture , engineering , geography , physics , archaeology , quantum mechanics , power (physics)