Hot-carrier induced degradation in surface pMOSFETs. | Zendy

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Hot-carrier induced degradation in surface pMOSFETs.

Author(s) -

Marinette Besson

Publication year - 2018

Language(s) - Uncategorized

Resource type - Dissertations/theses

DOI - 10.22215/etd/1994-02634

Subject(s) - degradation (telecommunications) , materials science , electrical engineering , engineering

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