Open AccessCharacterization of MOS devices fabricated on laser crystallized polysilicon.
Author(s) -
Kamalesh Dwivedi
Publication year - 2018
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.22215/etd/1982-00709
Subject(s) - materials science , characterization (materials science) , polysilicon depletion effect , optoelectronics , laser , engineering physics , nanotechnology , electrical engineering , engineering , optics , transistor , gate oxide , physics , voltage