
Development of a Spatially Resolving X-Ray Crystal Spectrometer (XCS) for Measurement of Ion-Temperature (Ti) and Rotation-Velocity (v) Profiles in ITER
Author(s) -
K. W. Hill,
L Delgado-Aprico,
Dennis W. Johnson,
Р. Федер,
Beiersdorfer,
J Dunn,
Kevin L. Morris,
E Wang,
M.L. Reinke,
Y. Podpaly,
J. E. Rice,
R. Barnsley,
M. O’Mullane,
S G Lee
Publication year - 2010
Language(s) - English
Resource type - Reports
DOI - 10.2172/981711
Subject(s) - physics , optics , spectrometer , toroid , detector , image resolution , rotation (mathematics) , doppler effect , nuclear physics , plasma , computer science , astronomy , artificial intelligence