A test protocol to screen capacitors for radiation-induced charge loss. | Zendy

Thomas Zarick | Zendy; Esther Hartman | Zendy

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A test protocol to screen capacitors for radiation-induced charge loss.

Author(s) -

Thomas Zarick,

Esther Hartman

Publication year - 2008

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/940528

Subject(s) - capacitor , protocol (science) , test (biology) , dielectric , charge (physics) , ionizing radiation , computer science , reliability engineering , test method , electronic engineering , electrical engineering , engineering , physics , voltage , nuclear physics , irradiation , mathematics , medicine , statistics , paleontology , alternative medicine , pathology , quantum mechanics , biology

This report presents a test protocol for screening capacitors dielectrics for charge loss due to ionizing radiation. The test protocol minimizes experimental error and provides a test method that allows comparisons of different dielectric types if exposed to the same environment and if the same experimental technique is used. The test acceptance or screening method is fully described in this report. A discussion of technical issues and possible errors and uncertainties is included in this report also

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