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Optimization of x-ray sources for proximity lithography produced by a high average power Nd:glass laser
Author(s) -
P. M. Celliers,
L. DaSilva,
C. Brent Dane
Publication year - 1995
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/93995
Subject(s) - laser , full width at half maximum , energy conversion efficiency , xenon , irradiation , materials science , wavelength , planar , analytical chemistry (journal) , optics , atomic physics , optoelectronics , physics , chemistry , nuclear physics , computer graphics (images) , chromatography , computer science
We measured the conversion efficiency of laser pulse energy into x-rays from a variety of solid planar targets and a Xe gas puff target irradiated using a high average power Nd:glass slab laser capable of delivering 13 ns FWHM pulses at up to 20 J at 1.053 {mu}m and 12 J at 0.53 {mu}m. Targets where chosen to optimize emission in the 9-19 {Angstrom} wavelength band, including L-shell emission from materials with atomic numbers in the Z=24-30 and M-shell emission from Xe (Z=54). With 1.053 {mu}m a maximum conversion of 10% into 2{pi} sr was measured from solid Xe and type 302 stainless steel targets. At 0.527 {mu}m efficiencies of 12-18%/(2{pi} sr) were measured for all of the solid targets in the same wavelength band. The x-ray conversion efficiency from the Xe gas puff target was considerably lower, at about 3%/(2{pi} sr) when irradiated with 1.053 {mu}m

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