Open AccessAtomic force microscope: Enhanced sensitivity
Author(s) -
Don Davis
Publication year - 1995
Language(s) - English
Resource type - Reports
DOI - 10.2172/93754
Subject(s) - interferometry , optical fiber , atomic force microscopy , microscope , optics , microfabrication , materials science , sensitivity (control systems) , deflection (physics) , fiber optic sensor , nanotechnology , optoelectronics , physics , electronic engineering , engineering , medicine , alternative medicine , pathology , fabrication
Atomic force microscopes (AFMs) are a recent development representing the state of the art in measuring ultrafine surface features. Applications are found in such fields of research as biology, microfabrication, material studies, and surface chemistry. Fiber-optic interferometer techniques developed at LLNL offer the potential of improving the vertical resolution of these instruments by up to 2 orders of magnitude. We are attempting to replace the current AFM measurement scheme, which consists of an optical beam deflection approach, with our fiber-optic interferometer scheme, a much more sensitive displacement measurement technique. In performing this research, we hope to accomplish two important goals; (1) to enhance the sensitivity of the AFM, and (2) to achieve important improvements in our fiber-optic interferometer technology