Open AccessNon-invasive current and voltage imaging techniques for integrated circuits using scanning probe microscopy. Final report, LDRD Project FY93 and FY94
Author(s) -
A. N. Campbell,
Edward I. Cole,
Paiboon Tangyunyong
Publication year - 1995
Language(s) - English
Resource type - Reports
DOI - 10.2172/93674
Subject(s) - work (physics) , national laboratory , voltage , electronic circuit , integrated circuit , electrical engineering , systems engineering , nanotechnology , computer science , engineering , materials science , mechanical engineering , engineering physics
This report describes the first practical, non-invasive technique for detecting and imaging currents internal to operating integrated circuits (ICs). This technique is based on magnetic force microscopy and was developed under Sandia National Laboratories` LDRD (Laboratory Directed Research and Development) program during FY 93 and FY 94. LDRD funds were also used to explore a related technique, charge force microscopy, for voltage probing of ICs. This report describes the technical work performed under this LDRD as well as the outcomes of the project in terms of publications and awards, intellectual property and licensing, synergistic work, potential future work, hiring of additional permanent staff, and benefits to DOE`s defense programs (DP)