Final report on LDRD project 52722 : radiation hardened optoelectronic components for space-based applications.
Author(s) -
Terry Hargett,
Darwin K. Serkland,
Ethan L. Blansett,
K.M. Geib,
Charles R. Sullivan,
Samuel D. Hawkins,
T. F. Wrobel,
Gordon A. Keeler,
John F. Klem,
Melissa Medrano,
Gregory M. Peake,
Gary H. Karpen,
Victoria Montano
Publication year - 2003
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/918264
Subject(s) - photodiode , radiation hardening , optoelectronics , radiation , materials science , electronics , optics , physics , electrical engineering , engineering
This report describes the research accomplishments achieved under the LDRD Project 'Radiation Hardened Optoelectronic Components for Space-Based Applications.' The aim of this LDRD has been to investigate the radiation hardness of vertical-cavity surface-emitting lasers (VCSELs) and photodiodes by looking at both the effects of total dose and of single-event upsets on the electrical and optical characteristics of VCSELs and photodiodes. These investigations were intended to provide guidance for the eventual integration of radiation hardened VCSELs and photodiodes with rad-hard driver and receiver electronics from an external vendor for space applications. During this one-year project, we have fabricated GaAs-based VCSELs and photodiodes, investigated ionization-induced transient effects due to high-energy protons, and measured the degradation of performance from both high-energy protons and neutrons
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