Mointoring Thickness Deviations in Planar Multi-Layered Elastic Structures Using Impedance Signatures | Zendy

Karl A. Fisher | Zendy

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Mointoring Thickness Deviations in Planar Multi-Layered Elastic Structures Using Impedance Signatures

Author(s) -

Karl A. Fisher

Publication year - 2007

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/914620

Subject(s) - planar , electrical impedance , materials science , transducer , acoustics , ultrasonic sensor , resonance (particle physics) , acoustic impedance , mechanical impedance , physics , computer science , electrical engineering , engineering , computer graphics (images) , particle physics

In this letter, a low frequency ultrasonic resonance technique that operates in the (20 - 80 kHz) regime is presented that demonstrates detection of thickness changes on the order of +/- 10{micro}m. This measurement capability is a result of the direct correlation between the electrical impedance of an electro-acoustic transducer and the mechanical loading it experiences when placed in contact with a layered elastic structure. The relative frequency shifts of the resonances peaks can be estimated through a simple one-dimensional transmission model. Separate experimental measurements confirm this technique to be sensitive to subtle changes in the underlying layered elastic structure

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