
The Role of Aspect Ratio and Beta in H-mode Confinement Scalings
Author(s) -
S. M. Kaye,
M. Valovič,
A. N. Chudnovskiy,
J.G. Cordey,
D. C. McDonald,
A. Meakins,
K. Thomsen,
R. Akers,
G. Bracco,
C. Brickley,
C. E. Bush,
A. Côté,
J. C. DeBoo,
M. Greenwald,
G. T. Hoang,
D. Hogweij,
F. Imbeaux,
Takumi Kawaguchi,
O. Kardaun,
A. Kus,
С. В. Лебедев,
V. M. Leonov,
Scott M. Lynch,
Yves Martin,
Yushi Miura,
J. Ongena,
G.W. Pacher,
C. C. Petty,
M. Romanelli,
F. Ryter,
K. Shinohara,
J. A. Snipes,
J. Stöber,
T. Takizuka,
K. Tsuzuki,
H. Urano
Publication year - 2005
Language(s) - English
Resource type - Reports
DOI - 10.2172/899588
Subject(s) - scaling , aspect ratio (aeronautics) , beta (programming language) , range (aeronautics) , statistical physics , physics , transformation (genetics) , standard deviation , mathematics , computational physics , materials science , statistics , computer science , chemistry , geometry , biochemistry , composite material , gene , optoelectronics , programming language