Conversion of Oxyfluoride Based Coated Conductors
Author(s) -
D.E. Wesolowski
Publication year - 2006
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/895036
Subject(s) - electrical conductor , trajectory , composition (language) , partial pressure , process (computing) , materials science , set (abstract data type) , process engineering , computer science , engineering physics , chemistry , physics , composite material , engineering , art , literature , organic chemistry , astronomy , oxygen , programming language , operating system
Direct measurements of HF pressure in equilibrium with the film during the BaF2 process are sorely needed. It is the HF partial pressure that governs the rate at which the film composition is changing and is, therefore, an important factor in controlling the composition/time trajectory of the film. Establishing the composition/time trajectory of both MOD-derived and e-beam derived films for a given set of conditions is another goal for the project. These studies will provide a fundamental understanding of the ex situ process for producing coated conductors
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