The Effect of Gas Ion Bombardment on the Secondary Electron Yield of TiN, TiCN and TiZrV Coatings For Suppressing Collective Electron Effects in Storage Rings | Zendy

F. Le Pimpec | Zendy; R. E. Kirby | Zendy; F. K. King | Zendy; M. Pivi | Zendy

Open Access

The Effect of Gas Ion Bombardment on the Secondary Electron Yield of TiN, TiCN and TiZrV Coatings For Suppressing Collective Electron Effects in Storage Rings

Author(s) -

F. Le Pimpec,

R. E. Kirby,

F. K. King,

M. Pivi

Publication year - 2006

Language(s) - English

Resource type - Reports

DOI - 10.2172/875817

Subject(s) - tin , secondary electrons , getter , materials science , electron , yield (engineering) , sputtering , secondary emission , cathode ray , ion , ionization , atomic physics , chemistry , thin film , metallurgy , nanotechnology , optoelectronics , physics , nuclear physics , organic chemistry

In many accelerator storage rings running positively charged beams, ionization of residual gas and secondary electron emission (SEE) in the beam pipe will give rise to an electron cloud which can cause beam blow-up or loss of the circulating beam. A preventative measure that suppresses electron cloud formation is to ensure that the vacuum wall has a low secondary emission yield (SEY). The SEY of thin films of TiN, sputter deposited Non-Evaporable Getters and a novel TiCN alloy were measured under a variety of conditions, including the effect of re-contamination from residual gas

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research