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Evaluating the Effects of Aging on Electronic Instrument and Control Circuit Boards and Components in Nuclear Power Plants
Author(s) -
G.W. Hannaman,
C.D.W. Wilkinson
Publication year - 2005
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/841248
Subject(s) - reliability (semiconductor) , reliability engineering , control (management) , nuclear power , power (physics) , signal (programming language) , computer science , nuclear power plant , electronic engineering , engineering , artificial intelligence , physics , nuclear physics , quantum mechanics , programming language
The report describes potentially useful techniques for monitoring the aging of I&C boards. The techniques have been grouped into: periodic testing, reliability modeling, resistance measures, signal comparison, eternal measures, and internal measures, each representing distinct theoretical approaches to detection and evaluation

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