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Zirconia-germanium interface photoemission spectroscopy using synchrotron radiation
Author(s) -
Chi On Chui
Publication year - 2005
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/839877
Subject(s) - germanium , materials science , heterojunction , germanium oxide , optoelectronics , band offset , cubic zirconia , analytical chemistry (journal) , gate dielectric , oxide , metal gate , x ray photoelectron spectroscopy , high κ dielectric , gate oxide , dielectric , band gap , silicon , chemistry , transistor , chemical engineering , composite material , electrical engineering , valence band , ceramic , voltage , metallurgy , engineering , chromatography

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