Open AccessPEP-II Hardware Reliability
Author(s) -
C. W. Allen
Publication year - 2005
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/839818
Subject(s) - mean time between failures , interrupt , reliability (semiconductor) , reliability engineering , work (physics) , work time , computer science , engineering , computer hardware , physics , microcontroller , failure rate , mechanical engineering , power (physics) , quantum mechanics
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom