Applications of Synchrotron X-Rays in Microelectronics Industry Research
Author(s) -
Jean JordanSweet
Publication year - 2005
Language(s) - English
Resource type - Reports
DOI - 10.2172/839729
Subject(s) - beamline , microelectronics , ibm , synchrotron , diffraction , engineering physics , optics , materials science , computer science , engineering , nanotechnology , physics , beam (structure)
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