Post-Removal Examination of GTF Cathode #2

This photo-cathode (PC), GTF Cathode No.2, was removed from the GTF in October, 2000. It was characterized in September, 1999 by G. Mulhollan and me (Report entitled ''A Brief Report on a Brief Examination of the Electropolished GTF Cathode'', LCLS-TN-99-10). The cathode conditions and results of that exam were: (1) The cathode was conventionally machined and cleaned in the SLAC Plating Shop. (2) The machining process left a central defect (400 microns diameter) which was not removed by electropolishing. (3) The electropolished surface was ''orange-peeled'', typical of excessive polishing. (4) Secondary electron microscopy (SEM) examination showed numerous 10 micron-diameter etch pits and a small number of copper surface particles. Operation of this cathode in the GTF exhibited ''hollow-beam'' behavior, suggesting that the central defect may have been responsible for non-normal emergence of the photo-emitted beam. No laser cleaning of the cathode was done, so all arc features are due to breakdowns. Post-removal analysis consisted of low-magnification digital camera pictures (taken with glancing-incidence tungsten white light illumination, to emphasize particles/pitting) and SEM. All images are available in digital (TIFF) form. Also available is a Power Point presentation of the results. Contact me for either. These image files are high-resolution and, thus,more » large in size. A 200K low-resolution contact sheet of a few images is attached to this report. Images are referred to by file name.« less