Open AccessTesting of High-Resolution Si and Ge Analyzers for X-ray Emission Spectroscopy and X-ray Raman Scattering
Author(s) -
Kimberley Reynolds
Publication year - 2004
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/833118
Subject(s) - beamline , focal length , optics , synchrotron , synchrotron radiation , spectrometer , monochromator , neon , wiggler , high energy x rays , germanium , resolution (logic) , x ray , physics , silicon , materials science , beam (structure) , atomic physics , nuclear physics , optoelectronics , lens (geology) , argon , electron , cathode ray , wavelength , artificial intelligence , computer science
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