An Aberration Corrected Photoemission Electron Microscope at the Advanced Light Source
Author(s) -
Jun Feng
Publication year - 2004
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/829710
Subject(s) - optics , undulator , beamline , spherical aberration , physics , microscope , resolution (logic) , electron , beam (structure) , computer science , lens (geology) , quantum mechanics , artificial intelligence
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