Open AccessLimitations on the use of scanning probe microscopy for the measurement of field emission from copper surfaces
Author(s) -
Y. Mizuno
Publication year - 2004
Language(s) - English
Resource type - Reports
DOI - 10.2172/826839
Subject(s) - field electron emission , electric field , plasma , electron , field emission microscopy , materials science , secondary emission , scanning electron microscope , atomic physics , field (mathematics) , copper , analytical chemistry (journal) , field ion microscope , molecular physics , chemistry , optics , composite material , ion , physics , diffraction , metallurgy , mathematics , organic chemistry , chromatography , quantum mechanics , pure mathematics
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