Open AccessStructural Characterization of a pentacene monolayer on an amorphous SiO2 substrate with grazing incidence x-ray diffraction
Author(s) -
S Fritz
Publication year - 2004
Language(s) - English
Resource type - Reports
DOI - 10.2172/826751
Subject(s) - pentacene , monolayer , materials science , amorphous solid , dielectric , organic semiconductor , thin film transistor , diffraction , substrate (aquarium) , semiconductor , crystallography , layer (electronics) , optoelectronics , optics , nanotechnology , chemistry , physics , oceanography , geology