TPV Network Sensitivity: A Simulation Study | Zendy

JL Vell | Zendy; JE Oppenlander | Zendy; William Gaes | Zendy; Darius Siganporia | Zendy; LR Danielson | Zendy

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TPV Network Sensitivity: A Simulation Study

Author(s) -

JL Vell,

JE Oppenlander,

William Gaes,

Darius Siganporia,

LR Danielson

Publication year - 2004

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/822280

Subject(s) - thermophotovoltaic , sensitivity (control systems) , diode , power (physics) , generator (circuit theory) , computer science , electronic engineering , fault (geology) , electrical engineering , engineering , photovoltaic system , physics , quantum mechanics , seismology , geology

A viable thermophotovoltaic power conversion system requires an electrically connected network of diodes that is designed to be fault tolerant for a prescribed power rating and generator life. This paper describes simulation studies investigating the sensitivity of various series/parallel network configurations to diode variability. The results show the effect of diode mismatch and reverse breakdown behavior on network performance

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