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Real-Time Monitoring of Oxidation on the Ti(0001) Surface by Synchrotron Radiation Photoelectron Spectroscopy and RHEED-AES
Author(s) -
Y. Mizuno
Publication year - 2003
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/815614
Subject(s) - x ray photoelectron spectroscopy , auger electron spectroscopy , reflection high energy electron diffraction , analytical chemistry (journal) , synchrotron radiation , electron diffraction , electron spectroscopy , materials science , chemistry , nuclear magnetic resonance , epitaxy , layer (electronics) , optics , diffraction , nanotechnology , physics , nuclear physics , chromatography

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