z-logo
open-access-imgOpen Access
Performance of Large Area Silicon Strip-Sensors for GLAST
Author(s) -
A. Kavelaars
Publication year - 2003
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/812950
Subject(s) - strips , leakage (economics) , wafer , optoelectronics , materials science , voltage , biasing , silicon , electrical engineering , breakdown voltage , optics , physics , engineering , composite material , economics , macroeconomics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom