Development of instrumentation for surface, interface and thin film science at the Advanced Photon Source. Final Technical Report for period September 15, 1994 - September 14, 2000 | Zendy

Michael J. Bedzyk | Zendy

Open Access

Development of instrumentation for surface, interface and thin film science at the Advanced Photon Source. Final Technical Report for period September 15, 1994 - September 14, 2000

Author(s) -

Michael J. Bedzyk

Publication year - 2000

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/811794

Subject(s) - instrumentation (computer programming) , advanced photon source , beamline , undulator , interface (matter) , engineering physics , engineering , optics , materials science , physics , beam (structure) , computer science , operating system , chemical engineering , pulmonary surfactant , gibbs isotherm

The P.I. and his research term successfully used the funds from the DOE Instrumentation grant entitled ''Development of Instrumentation for Surface, Interface and Thin Film Science at the Advanced Photon Source'' to design, build, test, and commission a customized surface science x-ray scattering/spectroscopy chamber. This instrumentation, which is presently in use at an APS x-ray undulator beam line operated by the DuPont-Northwestern-Dow Collaborative Access Team, is used for x-ray measurements of surface, interface, thin film, and nano-structures

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