Final report: DOE Grant ''Development of focusing monochromators for neutron scattering instruments'' (DE-FG02-96ER45599) | Zendy

M. Popovici | Zendy

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Final report: DOE Grant ''Development of focusing monochromators for neutron scattering instruments'' (DE-FG02-96ER45599)

Author(s) -

M. Popovici

Publication year - 2000

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/810264

Subject(s) - wafer , pyrolytic carbon , neutron , silicon , materials science , neutron diffraction , neutron scattering , bending , optics , bent molecular geometry , residual stress , diffraction , nuclear physics , physics , optoelectronics , composite material , chemistry , organic chemistry , pyrolysis

Bent crystal monochromators were developed for the neutron scattering community: (1) doubly focusing bulk silicon, for high-resolution neutron diffraction; (2) doubly focusing multi-wafer silicon, for residual stress instruments; (3) silicon-wafer: (a) with pneumatic spherical bending, (b) with mechanical cylindrical bending, (c) with mechanical two-dimensional bending, for high-resolution three-axis spectrometry; (4) doubly focusing multi-wafer silicon, for epithermal (eV range) neutrons; (5) doubly focusing composite pyrolytic graphite (low-cost), for high-flux applications

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