Transient Radiation Darkening Features in VISAR Window

We have studied and characterized radiation-induced changes in the index of refraction of materials used in Z experiments. Interferometric measurements of the radiation-induced change in the real part, n, of the complex index of refraction, N = n + iK, have been made in lithium fluoride (LiF), sapphire, and fused silica samples. Our results indicate that the index changes are small, with {delta}n/n {approx} 1 x 10{sup -5}/kGy. In addition, we have characterized the dose dependence of the radiation-induced transient radiation darkening (TRD) of these materials, which is related to K, the imaginary part of the refractive index. We have also measured time-resolved spectral profiles of TRD in LiF and sapphire, and have examined the results in terms of known color centers and possible colloid aggregation