X-ray scattering facility for dynamics of surfaces and interfaces. Final report
Author(s) -
E. W. Plummer
Publication year - 1999
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/761040
Subject(s) - machining , optics , surface (topology) , x ray optics , metrology , grinding , surface metrology , scattering , profilometer , mechanical engineering , materials science , engineering drawing , computer science , surface finish , engineering , physics , x ray , geometry , mathematics
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