Surface structure and analysis with scanning probe microscopy and electron tunneling spectroscopy. Final report | Zendy

Julia W. P. Hsu | Zendy

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Surface structure and analysis with scanning probe microscopy and electron tunneling spectroscopy. Final report

Author(s) -

Julia W. P. Hsu

Publication year - 1998

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/758935

Subject(s) - scanning tunneling microscope , atomic force microscopy , scanning electron microscope , scanning tunneling spectroscopy , materials science , spectroscopy , doping , quantum tunnelling , microscopy , surface structure , nanotechnology , conductive atomic force microscopy , electron microscope , analytical chemistry (journal) , optoelectronics , crystallography , chemistry , optics , physics , composite material , chromatography , quantum mechanics

This report summarizes the results accomplished during the funding period of this grant (June 1, 1995 to May 31, 1998). The projects are (1) room-temperature atomic force microscopy (AFM) studies of NbSe{sub 3} doped with various elements and (2) low-temperature scanning tunneling microscopy (STM) studies of NbSe{sub 3}. In addition, AFM was used to study the surface morphology and defects of GaAs films grown on Ge and Ge/Si substracts

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