Open AccessAdvanced Telemetry Data Capturing
Author(s) -
G.A. Paschke
Publication year - 2000
Language(s) - English
Resource type - Reports
DOI - 10.2172/754932
Subject(s) - maintainability , upgrade , reliability engineering , telemetry , reliability (semiconductor) , systems engineering , computer science , engineering , embedded system , operating system , telecommunications , power (physics) , physics , quantum mechanics
This project developed a new generation or advanced data capturing process specifically designed for use in future telemetry test systems at the Kansas City Plant (KCP). Although similar data capturing processes are performed both commercially and at other DOE weapon facilities, the equipment used is not specifically designed to perform acceptance testing requirements unique to the KCP. Commercially available equipment, despite very high cost (up to $125,000), is deficient in reliability and long-term maintainability necessary in test systems at this facility. There are no commercial sources for some requirements, specifically Terminal Data Analyzer (TDA) data processing. Although other custom processes have been developed to satisfy these test requirements, these designs have become difficult to maintain and upgrade