Basics of Bayesian reliability estimation from attribute test data
Author(s) -
Harry F. Martz,
Ray A. Waller
Publication year - 1975
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/7364917
Subject(s) - interval estimation , reliability (semiconductor) , point estimation , bayesian probability , bayes' theorem , computer science , interval (graph theory) , point (geometry) , bayesian statistics , prior probability , statistics , mathematics , data mining , bayesian inference , confidence interval , power (physics) , physics , geometry , quantum mechanics , combinatorics
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