Open AccessQuantitative analysis of thin foils using backscattering measurements. [He implants in Pd; composite Al/parylene]
Author(s) -
L. R. Mervine,
R. C. Der,
R. J. Fortner,
Thomas M. Kavanagh,
J. M. Khan
Publication year - 1971
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/7361608
Subject(s) - foil method , materials science , composite number , helium , parylene , palladium , thin film , aluminium , aluminum foil , composite material , elemental analysis , alloy , analytical chemistry (journal) , nanotechnology , chemistry , atomic physics , polymer , physics , layer (electronics) , chromatography , inorganic chemistry , biochemistry , catalysis
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